Japan IT Week Exhibit Information
April 9, 2019
Meritech Co., Ltd
Thank you very much for your continued support.
We are pleased to inform you that from May 8th, 2019 (Wednesday), we will be exhibiting at "Japan IT Week Spring Part 2" to be held at Tokyo Big Sight.
In the booth, we will introduce a test automation tool for smartphone applications and IoT based monitoring solution jointly developed by Japan and India.
It will be highly appreciated if you can kindly make some time out of your busy schedule and come and visit our booth.
We look forward to seeing you there.
- Program Details -
Date & Time: May 8th (Wed) to 10th (Fri), 10:00 to 18:00 ※ 10th (Friday) 17:00 Closed
Venue: Tokyo Big Sight Aomi Exhibition Hall ※ 2 minutes’ walk from Yurikamome-Line Tokyo Teleport Station
Pre-registration: Please register in advance and bring an invitation ticket from the following URL. If you contact us, we will send you an invitation.
Smartphone application test automation solution
Experitest - Smartphone Application Automated Testing Solution.
We automate testing of various smartphone applications on android, iOS, Web and contribute to the quality improvement.
Centra-SD Experitest products, it is a monitoring solution for various smartphone services.
We will monitor the Service level of our customers 24/7 and contribute to the improvement of service quality.
SIM Switcher-A solution that automates cumbersome SIM replacement tasks.
It also supports collaboration with Experitest products, and automates tests including SIM replacement.
IoT Training Kit-A training kit for CAT-M / NB-IoT made in India.
It supports various sensors and can perform trial of cellular IoT service etc. immediately.
Centra-IoT- A Cloud platform that visualizes sensor information from various IoT devices.
From small trials of IoT services to actual services, you can build and operate with simple UI.
SMART-M A tool for measuring mobile radio wave when installing M2M, IoT gateway, or IoT sensor.
The mobile radio wave of the installation environment of various devices can be measured and the pass / fail judgment can be performed with a simple operation.
For inquiries, please contact: Ito, Satake
TEL: 03-3552-1131 Email: firstname.lastname@example.org